Alexandre Boulle

CNRS Research Director

• Homepage
• Publications
• 2016 - 2020
• 2011 - 2015
• 2006 - 2010
• 2001 - 2005
• RaDMaX
• XRD equipment
• Contact Info

A complete list of my publications is accessible via the left menu. Alternatively, you can find publications at Research Gate or Google Scholar.

1. A. Boulle, Z. Oudjedi, R. Guinebretière, B. Soulestin, A. Dauger,"Ceramic nanocomposites obtained by sol-gel coating of submicron powders", Acta Mater. 49, 811 (2001)
2. A. Boulle, C. Legrand, R. Guinebretière, J.P. Mercurio, A. Dauger, "X-ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films", Thin Sol. Films 391, 42 (2001)
3. A. Boulle, O. Masson, R. Guinebretière, A. Dauger, "Miscut angles measurement and precise sample positioning with a 4-circle diffractometer", Appl. Surf. Sci. 180, 322 (2001)
4. A. Boulle, C. Legrand, R. Guinebretière, J.P. Mercurio, A. Dauger, "Stacking faults in layered Bi – containing perovskites studied by X-ray diffraction line profile analysis", J. Appl. Cryst. 34, 699 (2001)
5. A. Boulle, C. Legrand, R. Guinebretière, P. Thomas, J.P. Mercurio, A. Dauger, "Stacking disorder in Aurivillius compounds studied by line profile analysis", Mater. Sci. Forum 378-381, 753 (2001)
6. A. Boulle, C. Legrand, R. Guinebretière, J.P. Mercurio, A. Dauger, "Planar defects in Aurivillius compounds: an X-ray diffraction study", Philos. Mag. A 82, 615 (2002)
7. A. Boulle, L. Pradier, O. Masson, R. Guinebretière, A. Dauger, "Microstructural analysis in epitaxial zirconia layers", Appl. Surf. Sci. 188, 80 (2002)
8. A. Boulle, O. Masson, R. Guinebretière, A. Lecomte, A. Dauger, "A high resolution X-ray diffractometer for the study of imperfect materials", J. Appl. Cryst. 35, 606 (2002)
9. R. Guinebretière, A. Boulle, O. Masson, A. Dauger, "Cartographie du réseau réciproque sur couches d'oxydes épitaxiées à l'aide d'un montage équipé d'un détecteur courbe à localisation", J. Phys. IV 12, 273 (2002)
10. A. Boulle, L. Canale, R. Guinebretière, C. Girault-Di bin, A. Dauger, "Defect structure of pulsed laser deposited LiNbO3 / Al2O3 layers determined by XRD reciprocal space mapping", Thin Sol. Films 429, 55 (2003)
11. A. Boulle, O. Masson, R. Guinebretière, A. Dauger, "X-ray diffraction from epitaxial oxide layers grown from sol-gel", Thin Sol. Films 434, 1 (2003)
12. S. Liebus, A. Boulle, F. Cosset, C. Girault-Di Bin, R. Guinebretière, A. Bessaudou, J. C. Vareille, "Microstructural and microwave characterizations of pulsed laser ablated barium and strontium titanate thin films", Ferroelectrics 288, 49 (2003)
13. A. Boulle, O. Masson, R. Guinebretière, A. Dauger, "A new method for the determination of strain profiles in epitaxic thin films using X-ray diffraction", J. Appl. Cryst. 36, 1424 (2003)
14. A. Boulle, C. Restoin, C. Darraud-Taupiac, R. Guinebretière, A. Dauger, "X-ray diffraction characterisation of Ti indiffused periodically poled LiNbO3 fabricated by direct electron beam writing", Ferroelectrics Lett. 30, 91 (2003)
15. A. Boulle, R. Guinebretière, A. Dauger, "Etude de la microstructure de couches minces par diffraction des rayons X : description analytique des profils de raie", J. Phys. IV 118, 183 (2004)
16. A. Boulle, O. Masson, R. Guinebretière, A. Dauger, "Strain profiles in yttria stabilized zirconia epitaxial thin films determined by high resolution X-ray diffraction", Thin Sol. Films 450, 66 (2004)
17. R. Guinebretière, R. Bachelet, A. Boulle, O. Masson, A. Lecomte, A. Dauger, "Growth and relaxation of (Zr,Y)O2 epitaxial layers analyzed by XRD reciprocal space mapping", Mater. Sci. Eng. B 109, 42 (2004)
18. A. Boulle, O. Masson, R. Guinebretière, A. Dauger, "Two - dimensional XRD profile modeling in imperfect epitaxial layers", Diffraction analysis of the microstructure of materials, E. J. Mittemeijer, P. Scardi (Eds), Springer-Verlag, 505-526 (2004)
19. A. Boulle, R. Guinebretière, A. Dauger, "Highly localized strain fields due to planar defects in epitaxial SrBi2Nb2O9 thin films", J. Appl. Phys. 97, 073503 (2005).
20. O. Masson, A. Boulle, R. Guinebretière, A. Lecomte, A. Dauger, "On the use of one-dimensional position sensitive detector for X-ray diffraction reciprocal space mapping: data quality and limitations", Rev. Sci. Instr. 76, 063912 (2005)
21. R. Bachelet, G. Nahelou, A. Boulle, R. Guinebretière, A. Dauger, “Control of the morphology of oxide nano-islands through the substrate miscut angle”, Prog. Sol. State Chem. 33, 327 (2005)
22. A. Boulle, R. Guinebretière, A. Dauger, “Phenomenological analysis of heterogeneous strain fields in epitaxial thin films using X-ray scattering”, J. Phys. D: Appl. Phys. 38, 3907 (2005)
23. R. Guinebretière, A. Boulle, O. Masson, A. Dauger, “Instrumental aspects in X-ray diffraction on polycrystalline materials”, Powder Diff. 20, 294 (2005)