Alexandre Boulle

CNRS Research Director

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• 2016 - 2020
• 2011 - 2015
• 2006 - 2010
• 2001 - 2005
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A complete list of my publications is accessible via the left menu. Alternatively, you can find publications at Research Gate or Google Scholar.

1. A. Boulle, F. Conchon, R. Guinebretière, “Reciprocal space mapping of epitaxial thin films with crystallite size and shape polydispersity”, Acta Cryst. A 62, 11 (2006)
2. N. Olivi-Tran, A. Boulle, A. Gaudon, A. Dauger, “Morphological instabilities of a thin film on a Penrose lattice: a Monte Carlo study” Phys. Lett. A 351, 426 (2006)
3. A. Gaudon, F. Lallet, A. Boulle, A. Lecomte, B. Soulestin, R. Guinebretière and A. Dauger, “From amorphous phase separations to nanostructured functional materials in sol gel derived ZrO2:Eu3+/SiO2 and ZnO/SiO2 composites”, J. Non-Cryst. Sol. 352, 2152 (2006)
4. A. Boulle, R. Guinebretière, O. Masson, R. Bachelet, F. Conchon, A. Dauger, “Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: the case of yttria stabilized zirconia epitaxially grown on sapphire”, Appl. Surf. Sci. 253, 95 (2006)
5. A. Boulle, D. Chaussende, L. Latu-Romain, F. Conchon, O. Masson, R. Guinebretière, “Diffuse X-ray scattering from stacking faults in thick 3C-SiC single crystals”, Appl. Phys. Lett. 89, 091902 (2006)
6. A. Boulle, R. Guinebretière, A. Dauger, "X-ray diffraction from epitaxial thin films : an analytical expression of the line profiles accounting for microstructure", Z. Krist. 23, 123 (2006)
7. R. Guinebretière, A. Boulle, A. Dauger, "X-ray scattering from misfit dislocations in epitaxial oxide thin films", Z. Krist. 23, 263 (2006)
8. A. Boulle, F. Conchon, R. Bachelet, R. Guinebretière, A. Dauger, “Cartographie de l’espace réciproque appliquée à l’étude de la microstructure de couches minces d’oxydes”, Rayons X et Matière, Paris, Hermès Science Publications (2006)
9. R. Bachelet, S. Cottrino, G. Nahélou, V. Coudert, A. Boulle, B. Soulestin, F. Rossignol, R. Guinebretière, A. Dauger, “Self-patterned oxide nanostructures grown by sol-gel deposition on stepped surfaces”, Nanotech. 18, 051301 (2007)
10. R. Guinebretière, A. Boulle, R. Bachelet, O. Masson, P. Thomas, “High-temperature (1500 K) reciprocal space mapping on a laboratory X-ray diffractometer”, J. Appl. Cryst. 40, 332 (2007)
11. R. Bachelet, A. Boulle, B. Soulestin, F. Rossignol, R. Guinebretière, A. Dauger, “2D versus 3D post deposition grain growth in epitaxial oxide thin films. Influence of the substrate surface roughness”, Thin Sol. Films 515, 70 (2007)
12. P. Lenormand, A. Lecomte, C. Laberty-Robert, F. Ansart, A. Boulle, “Microstructural characterisation by X-ray scattering of perovskite-type La0.8Sr0.2MnO3±d thin films prepared by a dip-coating process”, J. Mater. Sci. 42, 4581 (2007)
13. S. Kilburger, R. Chety, E. Millon, Ph. Di Bin, C. Di Bin, A. Boulle, R. Guinebretière, “Growth of LiNbO3 thin films on sapphire by pulsed-laser deposition for electro-optic modulators”, Appl. Surf. Sci. 253, 8263 (2007)
14. A. Boulle, D. Chaussende, F. Pecqueux, F. Conchon, L. Latu-Romain, O. Masson, “Determination of stacking fault densities in 3C-SiC crystals by diffuse X-ray scattering”, Phys. Stat. Sol. A 204, 2528 (2007)
15. F. Conchon, A. Boulle, R. Guinebretière, “Misfit dislocations in highly mismatched oxide interfaces, an x-ray diffraction study”, Phys. Stat. Sol. A 204, 2535 (2007)
16. F. Conchon, A. Boulle, C. Girardot, S. Pignard, R. Guinebretière, E. Dooryhée, J. -L. Hodeau, F. Weiss, J. Kreisel, J. -F Bérar, “Epitaxial stabilization of SmNiO3 films on (001) SrTiO3 substrates”, J. Phys. D: Appl. Phys. 40, 44872 (2007)
17. C. Girardot, F. Conchon, A. Boulle, P. Chaudouet, N. Caillault, J. Kreisel, R. Guinebretière, F. Weiss, S. Pignard, “Influence of thickness on the epitaxial stabilisation of SmNiO3 thin films”, Surf. Coat. Technol. 201, 9021 (2007)
18. F. Conchon, A. Boulle, C. Girardot, S. Pignard, E. Dooryhée, R. Guinebretière, J.-L. Hodeau, “Influence of strain relaxation on the structural stabilization of SmNiO3 films epitaxially grown on (001) SrTiO3 substrates”, Mater. Sci. Eng. B 144, 32 (2007)
19. F. Conchon, A. Boulle, R. Guinebretière, C. Girardot, S. Pignard, J. Kreisel, F. Weiss, E. Dooryhée, J.-L. Hodeau, “Effect of tensile and compressive strains on transport properties of SmNiO3 layers epitaxially grown on (001) SrTiO3 and LaAlO3 substrates”, Appl. Phys. Lett. 91, 192110 (2007)
20. C. Restoin, J.-L. Auguste, G. Brasse, S. Hautreux, S. Février, J. M. Blondy, A. Boulle, A. Lecomte, “Advances in original fibres fabrication using innovative techniques”, Opt. Quant. Electr. 39, 1033 (2007)
21. A. Boulle, D. Chaussende, F. Conchon, G. Ferro, O. Masson, “Characterization of stacking faults in thick 3C-SiC crystals using high-resolution diffuse X-ray scattering”, J. Cryst. Growth 310, 982 (2008)
22. D. Chaussende, F. Mercier, A. Boulle, F. Conchon, M. Soueidan, G. Ferro, A. Mantzari, A. Andreadou, E. K. Polychroniadis, S. Juillaguet, J. Camassel, M. Pons, “Prospects for 3C-SiC Bulk Crystal Growth”, J. Cryst. Growth 310, 976 (2008)
23. F. Conchon, A. Boulle, R. Guinebretière, E. Dooryhée, J.-L. Hodeau, C. Girardot, S. Pignard, J. Kreisel, F. Weiss, “Role of strain-induced structural changes on the metal-insulator transition in epitaxial SmNiO3 films”, J. Phys.: Condens. Matter 20, 145216 (2008)
24. F. Conchon, A. Boulle, R. Guinebretière, E. Dooryhée, C. Girardot, S. Pignard, F. Weiss, J. Kreisel, L. Libralesso, T. L. Lee, “Investigation of strain and strain relaxation mechanisms in epitaxial SmNiO3 films using X-ray diffraction techniques”, J.Appl. Phys. 103, 123501 (2008)
25. J. R. Duclere, C. Cibert, A. Boulle, V. Dorcet, P. Marchet, C. Champeaux, A. Catherinot, S. Députier, M. Guilloux-Viry, “Lead-free Na0.5Bi0.5TiO3 ferroelectric thin films grown by pulsed laser deposition on epitaxial platinum bottom electrodes”, Thin Sol. Films 517, 592 (2008)
26. A. Boulle, F. Conchon, R. Guinebretière, “Strain profiles in thin films : influence of a coherently diffracting substrate and thickness fluctuations”, J. Appl. Cryst. 42, 85 (2009)
27. Y.C. Wu, W. Hamd, E. Thune, A. Boulle, C. Rochas, R. Guinebretière, “Synthesis of tin oxide nanosized crystals embedded in silica matrix through sol-gel process using alkoxide precursors”, J. Non-cryst. Sol. 355, 951 (2009)
28. A. Boulle, J. Aube, I. G. Galben-Sandulache, D. Chaussende, “The 3C – 6H polytypic transition in SiC as revealed by diffuse X-ray scattering”, Appl. Phys. Lett. 94, 201904 (2009)
29. A. Boulle, S. Kilburger, P. Di Bin, E. Millon, C. Di Bin, R. Guinebretière, A. Bessaudou, “Role of nanostructure on the optical waveguiding properties of epitaxial LiNbO3 films”, J. Phys. D: Appl. Phys. 42, 145403 (2009)
30. W. Hamd , Y. C. Wu, A. Boulle, E. Thune, R. Guinebretière, >“Microstructural study of SnO2 thin layers deposited on sapphire by sol gel dip coating”, Thin Sol. Films 518, 1 (2009)
31. E. Thune, A. Boulle, D. Babonneau, F. Pailloux, W. Hamd, R. Guinebretière, “Nanostructured sapphire vicinal surfaces as templates for the growth of self-organized oxide nanostructures”, Appl. Surf. Sci. 256, 924-928, 2009.
32. A. Boulle, D. Dompoint, I. Galben-Sandulache, D. Chaussende, “Defects and polytypism in SiC: the role of diffuse X-ray scattering”, AIP Conf. Proc. 1292, 43 (2010)
33. D. Dompoint, A. Boulle, I. Galben-Sandulache, D. Chaussende, “Study of the stability of 3C-SiC single crystals using high-resolution diffuse X-ray scattering”, AIP Conf. Proc. 1292, 71 (2010)
34. M. Bousquet, J.-R. Duclère, C. Champeaux, A. Boulle, P. Marchet, A. Catherinot, A. Wu, P. M. Vilarinho, S. Députier, M. Guilloux-Viry, A. Crunteanu, B. Gautier, D. Albertini, C. Bachelet, “Macroscopic and nanoscale electrical properties of pulsed laser deposited (100) epitaxial lead-free Na0.5Bi0.5TiO3 thin films”, J. Appl. Phys. 107, 034102 (2010)
35. S. Kilburger, E. Millon, P. Di Bin, A. Boulle, R. Guinebretière, C. Di Bin, “Properties of LiNbO3 based heterostructures grown by pulsed-laser -deposition for optical waveguiding application”, Thin Sol. Films 518, 4654 (2010)
36. W. Hamd, A. Boulle, E. Thune, R. Guinebretiere, “A new way to prepare tin oxide precursor gels”, J. Sol-Gel Sci. Technol. 55, 15 (2010)
37. M. Bousquet, J.-R. Duclère, E. Orhan, A. Boulle, C. Bachelet, C. Champeaux, P. Marchet, “Optical properties of an epitaxial Na0.5Bi0.5TiO3 thin film grown by laser ablation: experimental approach and density-functional theory calculations”, J. Appl. Phys. 107, 104107 (2010)
38. A. Boulle, D. Dompoint, I. Galben-Sandulache, D. Chaussende, “Quantitative analysis of diffuse X-ray scattering in partially transformed 3C-SiC single crystals”, J. Appl. Cryst. 43, 867 (2010)
39. A. Boulle, A. Debelle, “Strain profile determination in ion implanted single crystals using generalized simulated annealing”, J. Appl. Cryst. 43, 1046 (2010)
40. A. Debelle, L. Thomé, D. Dompoint, A. Boulle, F. Garrido, J. Jagielski, D. Chaussende, “Characterization and modeling of the ion-irradiation induced disorder in 6H-SiC and 3C-SiC single crystals”, J. Phys. D: Appl. Phys. 43, 455408 (2010)